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The Effect of Annealing Time on The Structural and Electrical Properties of CdTe Thin Films | ||
| journal of al-qadisiyah for pure science(quarterly) | ||
| Article 1, Volume 10, Issue 4, 2010, Pages 98-108 PDF (0 K) | ||
| Author | ||
| Naif H. AI-Hardan | ||
| Abstract | ||
| The effect of post annealing of CdTe thin film had been studied, the films were annealed at 400o C for 30, 60, 90 and 120 min, the effect of annealing time on the structure and electrical properties had been done, all the films had a well defined crystal structural. The mean crystallite size had been increased to 26 nm with annealing time up to 60 min at 400o C, after that time the mean crystallite size decreased. The behavior of sheet conductivity also effected to annealing time, and change from (9.33 x 10-12 S.□) for the as prepared CdTe thin films to (1.41 x 10-11 S. □) for the films annealed for 120 min, and also did the activation energy of these films. | ||
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