T. Salih, A., R. Gbashi, K., Kadhem Salman, T. (2018). Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer. , 14(1), 67-76.
Ammar T. Salih; Kadhim R. Gbashi; Tawfeeq Kadhem Salman. "Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer". , 14, 1, 2018, 67-76.
T. Salih, A., R. Gbashi, K., Kadhem Salman, T. (2018). 'Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer', , 14(1), pp. 67-76.
T. Salih, A., R. Gbashi, K., Kadhem Salman, T. Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer. , 2018; 14(1): 67-76.

Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer

Diyala Journal For Pure Science
Article 1, Volume 14, Issue 1, 2018, Pages 67-76
Authors
Ammar T. Salih; Kadhim R. Gbashi; Tawfeeq Kadhem Salman
Abstract
Uniform layers of SiO2 were prepared using thermal evaporation technique under high vacuum (10-5 mbar). Many characterizations were investigated using these films as antireflective layers. The morphological, crystal structural and optical properties of the layers were investigated by using SEM, XRD, and UV-Vis instruments.
Keywords
thin films; thermal evaporation; SiO; antireflection
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