Najim, J., alwahid, R., Rasheed, H. (2018). Study the Surface topography and electrical properties of GaAs:In / c-Si Composite Thin Films. , 12(1), 88-97. doi: 10.37652/juaps.2022.171604
Jobair A. Najim; rafa’a A.Abd alwahid; Hussain khazal Rasheed. "Study the Surface topography and electrical properties of GaAs:In / c-Si Composite Thin Films". , 12, 1, 2018, 88-97. doi: 10.37652/juaps.2022.171604
Najim, J., alwahid, R., Rasheed, H. (2018). 'Study the Surface topography and electrical properties of GaAs:In / c-Si Composite Thin Films', , 12(1), pp. 88-97. doi: 10.37652/juaps.2022.171604
Najim, J., alwahid, R., Rasheed, H. Study the Surface topography and electrical properties of GaAs:In / c-Si Composite Thin Films. , 2018; 12(1): 88-97. doi: 10.37652/juaps.2022.171604


Journal Management System. Powered by iJournalPro.com