A Review for Faults Recognition in Analog Electronic Circuits Based on a Direct Tester Board

Yahia, Elaf Hamzah; Alsanad, Hamid Radam; Mahmood, Hamzah Naser; Ahmed, Ali Amer; Al Mashhadany, Yousif Ismail

doi:10.37649/aengs.2025.157225.1121

	A Review for Faults Recognition in Analog Electronic Circuits Based on a Direct Tester Board
Anbar Journal of Engineering Sciences
Volume 16, Issue 1, May 2025, Pages 61-82 PDF (1.53 M)
Document Type: Review Paper
DOI: 10.37649/aengs.2025.157225.1121
Authors
Elaf Hamzah Yahia^* ¹; Hamid Radam Alsanad²; Hamzah Naser Mahmood³; Ali Amer Ahmed²; Yousif Ismail Al Mashhadany²
¹Electrical Engineering Department, Engineering College, University of Anbar, Anbar, Iraq
²Biomedical Engineering Research Center (BERC ), University of Anbar, Anbar, Iraq
³School of Electrical and Electronic Engineering, University Sains Malaysia, Nibong Tebal 14300, Pulau Pinang, Malaysia
Abstract
The detection of faults in electronic circuits is crucial to ensure the proper performance and reliability of electronic applications that utilize these devices. This work discovers, for the first time, that a direct tester board for fault diagnosis can be used not only for the intended measurement of current and voltage but also for studying the potential development of these magnitudes in inaccessible locations, as it detects register transfer level signals through oscilloscopes with low acquisition speeds. The experimental analysis carried out combines the use of commercial software with spatial distribution tracking and the exploitation of the sizes of network links in their computer graphical representation. The proper detection of malfunctions in electronic systems is crucial for enhancing their performance and reliability. We intend to explore the troubleshooting of analog electronic systems, for which we use wide-band direct tester boards. To evaluate its performance in routine practice, we perform experimentation using two different analog circuits designed. They consist of conventional operational amplifiers and element modeling based on equivalent resistance-capacitance networks. Given the procedure followed, commercial programs were used. Special mention should be made of the conclusion matrix, which is interesting when selecting suitable diagnostic parameters. The effectiveness of direct measurement based on integrated probes in the two projects, which allowed for fault insertion, was also confirmed. The results and discussions were enriched by the summarized experimental test report. The work concludes with a reflection on the relationship between this work and the existing state of the art, as well as the new challenges posed by international researchers.
Keywords
Fault Detection; Analog Electronic Circuits; Experimental Analysis

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