A. Al-Aani, M. (2010). Effect of the Thickness and Annealing Temperature on the Structural Properties of Thin CdS Films Prepared by Thermal Evaporation. , 8(11), 1-7.
Muhammad A. Al-Aani. "Effect of the Thickness and Annealing Temperature on the Structural Properties of Thin CdS Films Prepared by Thermal Evaporation". , 8, 11, 2010, 1-7.
A. Al-Aani, M. (2010). 'Effect of the Thickness and Annealing Temperature on the Structural Properties of Thin CdS Films Prepared by Thermal Evaporation', , 8(11), pp. 1-7.
A. Al-Aani, M. Effect of the Thickness and Annealing Temperature on the Structural Properties of Thin CdS Films Prepared by Thermal Evaporation. , 2010; 8(11): 1-7.

Effect of the Thickness and Annealing Temperature on the Structural Properties of Thin CdS Films Prepared by Thermal Evaporation

Iraqi Journal of Physics
Article 1, Volume 8, Issue 11, 2010, Pages 1-7
Author
Muhammad A. Al-Aani
Abstract
A thin CdS Films have been evaporated by thermal evaporation technique with different thicknesses (500, 1000, 1500 and 2000Å) and different duration times of annealing (60, 120 180 minutes) under 573 K annealing temperature, the vacuum was about 8 × 10-5 mbar and substrate temperature was 423 K. The structural properties of the films have been studied by X- ray diffraction technique (XRD). The crystal growth became stronger and more oriented as the film thickness (T) and duration time of annealing
( Ta) increases.
Keywords
CdS Structural Properties
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