- All Journals
- Al-Qadisiyah University
- Basrah University
- Kirkuk University
- Mosul University
- The Iraqi Borad for Medical Specialization
- University of Anbar
- University of Technology
- Al Mustafa University
- Al-Zahraa University for Women
- Alnoor University
- Kunooz University
- Misan University
- Ninevah University
- Tikrit University
- University of Al-Hamdaniya
- University of Kerbala
Linear Graded Refractive Index Antireflection Coatings For Silicon Substrate | ||
| Engineering and Technology Journal | ||
| Article 1, Volume 29, Issue 15, 2011, Pages 3204-3210 PDF (192.53 K) | ||
| DOI: 10.30684/etj.29.15.14 | ||
| Author | ||
| Muhammed Abdulredha Husein | ||
| Abstract | ||
| In this work, a theoretical study of linear profile for graded antireflection coating has been used with silicon as substrate. A computer program has been designated using the basic equations of thin film, and the reflectance has been obtained over a wide range of wavelengths (400-1000 nm) as well as incident angles (0-60 degree) for many film thicknesses. The film consist of hydrogenated nitrides, it was shown that the reflectance decreases as the thin film thickness increases. The reflectance reaches to less than 1% for thin film thickness 0.6 ìm. | ||
| Keywords | ||
| Graded refraction index; Antireflection for solar cell; Graded thin layer | ||
|
Statistics Article View: 370 PDF Download: 193 |
||