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Data Acquisition of TiO2 for Optical Material by using Spectroscopic Ellipsometry Technique | ||
| Engineering and Technology Journal | ||
| Article 1, Volume 28, Issue 20, 2010, Pages 6128-6139 PDF (397.89 K) | ||
| DOI: 10.30684/etj.28.20.12 | ||
| Author | ||
| Asad Sabih Mohammad Raouf | ||
| Abstract | ||
| An Ellipsometric experimental set up of SOPRA ES4G type with a powerful WVASE software for the theoretical calculus of the Ellipsometry parameters. The Ellipsometry Technique can determine amplitude and phase information Ψ( and Δ) dependent on wavelength range 250 nm to 900 nm (1.5 - 5 eV), including original practical solutions, were developed. Encouraging results of TiO2 were obtained in applying the simple Ellipsometric method of azimuths to determine the optical constants for TiO2 with this optoelectronic device. | ||
| Keywords | ||
| Ellipsometry; Optical properties; thin film | ||
|
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