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The Electrical Characteristics of ( CdS – CdTe ) Structure Thin Films | ||
| Rafidain Journal of Science | ||
| Article 12, Volume 19, Issue 1, 2008, Pages 98-106 PDF (0 K) | ||
| DOI: 10.33899/rjs.2008.42302 | ||
| Author | ||
| Amir M. Nory | ||
| Abstract | ||
| Thin films of (CdS – CdTe ) have been fabricated on glass substrates using vacuum thermal evaporation technique. The effect of substrate temperature on the electrical characteristics for the fabricated structure at (4000 0A ) thickness with 2 0A / sec deposition rate have been investigated. The substrate temperature was very important parameter on the fabricated films , and a good adhesion film obtained at (170 0C). Resistivity of the films decreased as the substrate temperature increased up to (170 0C) and then started increasing gradually at temperatures above 170 0C. Also, has been observed that the resistivity decreased with increasing the biasing voltage. The linear relation for ( I –V ) characteristics at different substrate temperatures has been obtained for fabricated films. | ||
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