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Increasing the Conductivity of Cadmium Telluride Films | ||
| Engineering and Technology Journal | ||
| Article 1, Volume 27, Issue 14, 2009, Pages 2682-2691 PDF (271.16 K) | ||
| DOI: 10.30684/etj.27.14.13 | ||
| Authors | ||
| Muslm Fadhel Al-Zubadi; Waseem Najeeb Ibrahim | ||
| Abstract | ||
| The structural , optical and electrical properties of vacuum-evaporated CdTe thin films were investigated as a function of post-deposition annealing without and with CdCl2 treatment at 300˚C for 15min . X-Ray diffraction studies of the asdeposited films revealed polycrystalline in nature with cubic structure . The intensity of the (111) peak increased with the CdCl2 annealing treatment , and there is an increasing in the grain sizes after the CdCl2 annealing treatment with voids around the grain boundaries from the surface morphologies after the CdCl2 annealing treatment . The optical band gap values , Eg , were 1.56, 1.54 and 1.38 eV for film deposited at room temperature and after annealing without and with CdCl2 treatment at 300˚C for 15min respectively . Furthermore , the activation energy decreases after heat treatment without and with CdCl2 for CdTe thin films. | ||
| Keywords | ||
| Cadmium telluride; CdCl; Optical; Xray diffraction; Thin films | ||
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