Nagarajan, R., Yaacob, S., Pandian, P., Karthigayan, M., Rizon, M. (2006). FEATURE EXTRACTION METHODS FOR IC CHIP MARKING INSPECTION A COMPARISON. , 2(1), 7-18. doi: 10.33762/eeej.2006.55331
R. Nagarajan; Sazali Yaacob; Paulraj Pandian; M. Karthigayan; Mohamed Rizon. "FEATURE EXTRACTION METHODS FOR IC CHIP MARKING INSPECTION A COMPARISON". , 2, 1, 2006, 7-18. doi: 10.33762/eeej.2006.55331
Nagarajan, R., Yaacob, S., Pandian, P., Karthigayan, M., Rizon, M. (2006). 'FEATURE EXTRACTION METHODS FOR IC CHIP MARKING INSPECTION A COMPARISON', , 2(1), pp. 7-18. doi: 10.33762/eeej.2006.55331
Nagarajan, R., Yaacob, S., Pandian, P., Karthigayan, M., Rizon, M. FEATURE EXTRACTION METHODS FOR IC CHIP MARKING INSPECTION A COMPARISON. , 2006; 2(1): 7-18. doi: 10.33762/eeej.2006.55331

FEATURE EXTRACTION METHODS FOR IC CHIP MARKING INSPECTION A COMPARISON

Iraqi Journal for Electrical And Electronic Engineering
Article 1, Volume 2, Issue 1, 2006, Pages 7-18    PDF (0 K)
DOI: 10.33762/eeej.2006.55331
Authors
R. Nagarajan; Sazali Yaacob; Paulraj Pandian; M. Karthigayan; Mohamed Rizon
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