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Light-Beam-Induced-Current Analysis of Thin-Film Polycrystalline Solar Cells | ||
| Iraqi Journal of Applied Physics | ||
| Article 1, Volume 7, Issue 4, 2011, Pages 29-32 | ||
| Authors | ||
| G.A. Elsayed; R.M. Basyouni | ||
| Abstract | ||
| Light-beam-induced-current (LBIC) measurements are providing a direct link between the spatial non-uniformities inherent in thin-film polycrystalline solar cells, such as CdTe and CIGS, and the overall performance of these cells. LBIC is uniquely equipped to produce quantitative maps of local quantum efficiency with relative ease. Spatial resolution of 1 m at 1-sun intensity, and return to the same area after other measurements, is routinely achieved. A wavelength range of 638nm to 857nm is available with diode lasers. The LBIC measurements demonstrate that several types of effects that alter cell performance can be traced to specific local-area features. Examples of such effects include defects related to edges, grids, or scribes, spatial variations in alloying, and local changes due to high-temperature stress. | ||
| Keywords | ||
| Thin films; LBIC Analysis; Polycrystalline Solar Cells; CIGS | ||
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