Structural and optical properties for nano GaxSb1-x films

A.H.Jalaukhan,; H.Kh.Al-Lamy,; M.F.A.Alias,

	Structural and optical properties for nano GaxSb1-x films
Iraqi Journal of Physics
Article 1, Volume 10, Issue 18, 2012, Pages 24-28
Authors
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Abstract
Alloys of GaxSb1-x system with different Ga concentration (x=0.4, 0.5, 0.6) have been prepared in evacuated quartz tubes. The structure of the alloys were examined by X-ray diffraction analysis (XRD) and found to be polycrystalline of zincblend structure with strong crystalline orientation (220). Thin films of GaxSb1-x system of about 1.0 μm thickness have been deposited by flash evaporation method on glass substrate at 473K substrate temperature (Ts) and under pressure 10-6 mbar. This study concentrated on the effect of Ga concentration (x) on some physical properties of GaxSb1-x thin films such as structural and optical properties. The structure of prepared films for various values of x was polycrystalline. The X-ray diffraction analysis (XRD) for GaxSb1-x showed that the preferential orientation was (111) for all values of Ga concentration. The grain size was varied with Ga concentration. The optical analysis is performed with the FT-IR spectrophotometer. The optical measurement showed that GaxSb1-x thin films has direct energy gap .It is found that the optical energy gap increased when x increased with the range (x=0.4, 0.5 and 0.6). The optical constant for GaxSb1-x films was varied with increasing x. These prepared polycrystalline GaxSb1-x thin film was a good candidate for use as a base layer material in thermo photovoltaic (TPV).
Keywords
GaxSb; x alloys and thin films; flash; Evaporation; Structural and Optical Properties

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