N. Mohammad, A. (2013). Monte Carlo Observations of Atomic Number Dependence Of Saturation Thickness For Multiple Back-Scattering Photons From Thick Samples. , 24(3), 117-124.
A. N. Mohammad. "Monte Carlo Observations of Atomic Number Dependence Of Saturation Thickness For Multiple Back-Scattering Photons From Thick Samples". , 24, 3, 2013, 117-124.
N. Mohammad, A. (2013). 'Monte Carlo Observations of Atomic Number Dependence Of Saturation Thickness For Multiple Back-Scattering Photons From Thick Samples', , 24(3), pp. 117-124.
N. Mohammad, A. Monte Carlo Observations of Atomic Number Dependence Of Saturation Thickness For Multiple Back-Scattering Photons From Thick Samples. , 2013; 24(3): 117-124.

Monte Carlo Observations of Atomic Number Dependence Of Saturation Thickness For Multiple Back-Scattering Photons From Thick Samples

Al-Mustansiriyah Journal of Science
Article 1, Volume 24, Issue 3, 2013, Pages 117-124
Author
A. N. Mohammad
Abstract
Multiple scattering of 662 keV photons in the backward direction from elemental scatterers, (6C, 13Al, 26Fe, 50Sn, 65Tb and 82Pb), is simulated by Monte Carlo method with a view to estimate its atomic number Z-dependence. The thickness of scatterers was varied up to 20 cm (5.718 mean free paths). The relative contribution of multiple scattering events in the backward direction is found to increase with the sample (scatterers) thickness and to saturate around particular value called saturation thickness (S.T.) that satisfies the fitted relation, that of type rational functions, as:
S.T.=((a+bZ))⁄((1+cZ+dZ^2 ) ).
The saturation thickness decreases with increasing atomic number of material sample and these results show good agreement with the reported experimental results.
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