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Study of Optical Properties of ZnSe Thin Films Prepared by Thermal Evaporation | ||
| Al-Mustansiriyah Journal of Science | ||
| Article 1, Volume 21, Issue 2, 2010, Pages 105-110 | ||
| Author | ||
| Ibrahim R. Agool | ||
| Abstract | ||
| In this work the compound of Zinc selenide (ZnSe) for different thickness were deposited on glass substrate at temperature (323 K), using resistance heating evaporation technique under high vacuum condition (the base pressure is 10-5 torr). The polycrystalline thin films with thicknesses 180, 240 and 300 nm are found to have direct bandgaps with values 2.69, 2.68 and 2.66 eV respectively. The amorphous film with thickness 60 nm has a direct bandgap and is found to be smaller than that of polycrystalline thin films which is equal to 2.57 eV. The optical parameters of ZnSe thin films which have been investigated, include the transmittance, absorbance and reflectance. The films have been found to exhibit high transmittance ranged between 75-99%, low absorbance, and low reflectance in the visible region. The absorbance of the films is found to be high in the ultraviolet region. | ||
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