A. A. Dakhel, U. (2011). Study the Effect of Thermal Annealing on Structural Properties of PbSe Thin Films Prepared by Thermal Evaporation in Vacuum. , 22(2), 159-166.
Usama A. A. Dakhel. "Study the Effect of Thermal Annealing on Structural Properties of PbSe Thin Films Prepared by Thermal Evaporation in Vacuum". , 22, 2, 2011, 159-166.
A. A. Dakhel, U. (2011). 'Study the Effect of Thermal Annealing on Structural Properties of PbSe Thin Films Prepared by Thermal Evaporation in Vacuum', , 22(2), pp. 159-166.
A. A. Dakhel, U. Study the Effect of Thermal Annealing on Structural Properties of PbSe Thin Films Prepared by Thermal Evaporation in Vacuum. , 2011; 22(2): 159-166.

Study the Effect of Thermal Annealing on Structural Properties of PbSe Thin Films Prepared by Thermal Evaporation in Vacuum

Al-Mustansiriyah Journal of Science
Article 1, Volume 22, Issue 2, 2011, Pages 159-166
Author
Usama A. A. Dakhel
Abstract
In this paper the effect of thermal annealing on the structural characterization of PbSe thin films were studied. The thin films were deposited on glass substrates at room temperature using thermal technique under the pressure of 10-5 Torr, later they were annealed at different temperatures for one hour.
The structural characteristics of the prepared samples were investigated by using X-ray diffraction (XRD) technique, it is used to determine the crystalline structure. The grain size of the films (D) were determined from the XRD pattern of the prepared films according to Sherrer's equation. Other structural parameters were calculated such as microstrain (ε), and dislocation density (ρ) using a mathematical relations related each parameter with the grain size
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