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A Study of the Deposition Angle Effect on the Structural Properties of (Cds) Thin Films | ||
| Al-Mustansiriyah Journal of Science | ||
| Article 1, Volume 22, Issue 2, 2011, Pages 167-176 | ||
| Authors | ||
| ; Raad S. Al | ||
| Abstract | ||
| In this research, A study of structural properties for (CdS) thin films prepared by thermal vacuum deposition method on glass substrates at different angles and different film thicknesses. The X-ray diffraction technique (XRD) has been used to study the structural properties of (CdS) films deposited at oblique angles and it appeared that the films are polycrystalline, and there is a high intensity peak (111).The increase of deposition angle will increase the reflection intensity of (111) plane and decrease the grain size, while the increasing of film thickness will also increase the reflection intensity of (111) plane but decrease the grain size. The influence of increasing deposition angle is greater than the influence of increasing films thicknesses on the studying properties | ||
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