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Chemical Spray Deposition for Tellurium Thin Film | ||
| Journal of University of Babylon | ||
| Article 1, Volume 21, Issue 3, 2013, Pages 981-986 | ||
| Author | ||
| Janan H. Saadee | ||
| Abstract | ||
| In this work, a chemical spray pyrolysis thin film of Tellurium has been reported. The film is deposited on thin glass substrate at temperature of 498 ± 283 K to study its structure and electrical properties. The electrical properties are studied through variation of resistivity with temperature in the thermal range of 313 to 473 K as well as measurement of electrical conductivity and activation energy are performed. The results of Hall's effect showed that the prepared film is P-type. X-ray diffraction spectrum has shown that the prepared film has polycrystalline structure and peaks for Tellurium hexagonal structure. Also, the microstructure analysis using optical microscope illustrated the contrast of topography of this thin film which showed highest homogeneity and regularity | ||
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