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Quantifying Inhomogeneities in Silicon-Rich Oxide Thin Films | ||
| Iraqi Journal of Applied Physics | ||
| Article 1, Volume 9, Issue 3, 2013, Pages 36-38 | ||
| Author | ||
| M. Ivanda | ||
| Abstract | ||
| Spectroscopic techniques can be used to estimate structural inhomogeneities in silicon oxide thin films. | ||
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