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FOCUSING OF CHARGED PARTICLES BEAM PASSING THROUGH A SYSTEM OF TWO IDENTICAL MAGNETS | ||
| Journal of College of Education | ||
| Article 1, Volume 0, Issue 3, 2017, Pages 29-52 | ||
| Authors | ||
| Intesar H. Hashim; Sarmad H. Saleh | ||
| Abstract | ||
| In this work, we use two magnets placed in front of the path of charged particles to obtain the best focusing of charged particles in both the horizontal and vertical planes. We trace the path of charged particles from the extraction region at the ion source, until reach to the target were traced. The process of tracing the path of charged particles is performed using matrices in each region in which passing the charged particles, starting from the extraction region reaching to the target by describing the charged particle beams as phase space ellipse in both the horizontal and vertical planes. The movement of the charged particle beams in those planes are independent from one another. Keywords | ||
| Keywords | ||
| Ion Beam Transport; Charged Particles Beam; Double Focusing; Magnet Deflector | ||
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