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Density of states of CdTe thin films | ||
| Al-Mustansiriyah Journal of Science | ||
| Article 1, Volume 22, Issue 5, 2011, Pages 284-294 | ||
| Author | ||
| Issam M. Ibrahim | ||
| Abstract | ||
| The effect of annealing temperature (Ta) on the ac conductivity, real and imaginary part of dielectric constant (r,i), relaxation time () had been measured for CdTe thin films with 300nm thickness which were prepared at room temperature(R.T) using thermal evaporation under vacuum. Measurements of ac conductivity over frequency range (102-105 Hz) in temperature range 303K to 473K, showed that the ac conductivity obeys the formula ac=Aws, where (s) lies between (0.3-0.95).ac declared exponentially dependence on the frequency range. The results show that distribution parameter(Polarizibility) () decreases while microscopic relaxation time (0) increases with the increasing annealing temperatures. Optical energy gap and tails width were measured in the range of (200-900nm) which revealed allowed direct transition. Finally we suggested an experimental model for density of states. | ||
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