T. Salem, E. (2010). X-ray Diffraction and FTIR Spectra of SnO2 Thin Film Prepared Using RTO Method. , 21(5), 89-102.
Evan T. Salem. "X-ray Diffraction and FTIR Spectra of SnO2 Thin Film Prepared Using RTO Method". , 21, 5, 2010, 89-102.
T. Salem, E. (2010). 'X-ray Diffraction and FTIR Spectra of SnO2 Thin Film Prepared Using RTO Method', , 21(5), pp. 89-102.
T. Salem, E. X-ray Diffraction and FTIR Spectra of SnO2 Thin Film Prepared Using RTO Method. , 2010; 21(5): 89-102.

X-ray Diffraction and FTIR Spectra of SnO2 Thin Film Prepared Using RTO Method

Al-Mustansiriyah Journal of Science
Article 1, Volume 21, Issue 5, 2010, Pages 89-102
Author
Evan T. Salem
Abstract
Transparent conducting oxide thin films of SnO2 has been prepared on quartz substrates at different oxidation conditions such as oxidation temperature and oxidation time using rapid thermal oxidation method. The films crystallize is a tetragonal structure and X-ray diffraction measurements have shown polycrystalline SnO2 films prepared at 873 K, 90 sec with (101) orientation. The SnO2 phase formation was also confirmed with the recorded Fourier Transform Infrared (FTIR) results.
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