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Characterization of CdOfilm AFM and XRDDiffractionUsing Rietveld Refinement | ||
| Ibn Al-Haitham Journal For Pure And Applied Science | ||
| Article 1, Volume 27, Issue 1, 2014, Pages 83-92 | ||
| Authors | ||
| ; Ziad T. Khodair | ||
| Abstract | ||
| Nano particles of Cadmium Oxide (CdO) thin films were prepared by spray pyrolysis technique. The synthesized film is annealed at (200, 300, 450) o C for 3 hours . The XRD and AFM for the analysis of its structural and micro-structural characteristic has been preformed. The average grain size was found to be about 32.50 nm .There is a preferred orientation along (200) plane with texture coefficient 1.79,1.644,1.763 and 1.792 for deposited and annealed films, corresponding to grain size 57,58 ,51 and 51 nm. Thevariationsof stress with temperature is ranged from0.157 -0.376 GPa . | ||
| Keywords | ||
| Spray Pyrolysis; Preferred orientation; Rietveld Refinement; Grain size; Nano CdO | ||
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